John Egan is a veteran personal finance writer whose work has been published by outlets such as Bankrate, Experian, Newsweek Vault and Investopedia. Michelle is a lead editor at Forbes Advisor. She ...

Abstract: In this article, we present an in-depth high-temperature analysis of the long-term gate reliability in GaN-based power high-electron-mobility transistors (HEMTs) with p-type gate. Three ...

The year 1939 is often cited as the high-point of American filmmaking, the evidence including “Gone With the Wind,” “The Wizard of Oz,” “Stagecoach,” “Mr. Smith Goes to Washington” and “Ninotchka.” In ...

Abstract: The importance of the Insulate Gate Bipolar Transistor reliability has significantly increased due to the widespread use and target application of these devices which includes power ...