Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

http://www.xilinx.comAs the density of field-programmable-gate arrays (FPGAs) continues to increase, engineers are challenged to come up with ways to test and verify ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Semiconductor design, manufacturing, and test are becoming much more tightly integrated as the chip industry seeks to optimize designs using fewer engineers, setting the stage for greater efficiencies ...

The CET is available to gauge a defect when the plaintiff produced evidence of the objective conditions of the product as to which the jury may employ its own sense of whether the product meets ...

Congratulations to the LEAP Awards for Test & Measurement winners, who are profiled here: Liquid Instruments’ Moku:Delta is ...