Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...
Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
The engineering services market is now disrupting the IT services marketplace. The move to technology platforms and the requisite number of engineers causes a dilemma for CIOs. The need for ...
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